Function 1: Incoming material detection; the quality of the IC is invisible to the naked eye. It must be detected by power-on. The current, voltage, inductance, resistance, and capacitance of the IC can not be completely judged by the usual methods; Use the IC to test the fixture, run the program and simulate the various functions of the IC to judge the quality of the IC.

Function 2: Rework and inspection; if there is a problem with the motherboard, is it the motherboard or the IC? Hard to judge! With the IC test fixture, everything is easy to say. Put the removed IC in the fixture to eliminate the reason for whether the IC is placed on the surface;

       Function three: IC sub-inspection; the repaired IC may be damaged during the removal process. The IC test fixture can be used to separate the broken IC, which can save a lot of manpower and material resources, thereby reducing various costs. Take the BGA packaged IC as an example. If the IC is not sub-inspected, the broken IC is pasted and checked by the FCT test, and then the IC is removed, baked and cleaned, which is troublesome and may damage the motherboard. The above problems will not occur with IC fixture testing.